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Data · dataset · 2023

Numerical Aperture Measurement Based on Ronchi Lateral Interferometry

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The experiment was conducted in the double-grating Ronchi LSI system.

Description

The light source is a monochromatic light-emitting diode (LED) with λ = 532 nm. The objective lens under test has a magnification of 5× and a NA of 0.3.

The periods of the object-plane grating and the image-plane grating are 75.2 μm and 15.04 μm, respectively. The image-plane grating is moved along the axial direction (z direction) in the study, and the x-sheared and y-sheared wavefront at the corresponding positions are measured using the (3N+1)-frame algorithm, then calculated the x-tilt coefficients of Zernike terms (Z2) of x-sheared wavefront and the y-tilt coefficients of Zernike terms (Z3) of y-sheared wavefront. The original measurement data were collected on July 23, 2021.

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Catalogue records · 1

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Inferred from text
Geomatic engineering 69%
Provenance · 1 source records, 11 field assertions
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ScienceDB10.57760/sciencedb.0710712 d agoJSON v1
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