Raman Spectroscopy and X-ray Diffraction Characterization Data for Tetragonal Germanium Dioxide Synthesis Experiments

This dataset contains spectroscopic characterization data generated during the synthesis experiment of tetragonal germanium dioxide, mainly including: (1) Raman spectroscopic data of hexagonal germanium oxide before and after the reaction; (2) X-ray diffraction (XRD) pattern of hexagonal germanium oxide before reaction; (3) XRD patterns of tetragonal germanium oxide synthesized under different pressure conditions (13-400 bar) in the temperature range of 200-450 ℃; (4) XRD patterns of tetragonal germanium oxide synthesized under different oxygen fugacity buffer conditions (no buffer, Ni NiO, Fe3O4 Fe2O3, MoO2 MoO3) at 450 ℃ and 100 bar.

The above experiments were completed in the State Key Laboratory of Mineral Deposit Geochemistry, Institute of Geochemistry, Chinese Academy of Sciences. The Raman spectroscopy was conducted using the new generation LabRAM HR Evolution Raman spectrometer produced by HORIBA JOBIN YVON company. The XRD pattern was obtained using an Empyream type powder crystal X-ray diffractometer with a Cu K α radiation source (λ=1.5406 Å), a tube voltage of 40kV, a tube current of 40mA, and a scanning range of 2 θ=10 ° -70 °.