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Structure · dataset · 2015

Microstructure and electrical properties of co-sputtered Cu embedded amorphous SiC

Listed in DataCite

Dataset of figures in the paper "Microstructure and electrical properties of co-sputtered Cu embedded amorphous SiC".

Description

These dataset including EDS, XRD, SEM, low-temperature resistance, resistivity measurements on a-SiC:Cu films and capcitance and current density-voltage measurements on Cu/a-SiC:Cu/Au microcapacitors.

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Where it is published

Catalogue records · 2

Topics

Stated by source
Materials engineering
From keywords
Materials Science
Provenance · 1 source records, 5 field assertions
SourceKeyLast seenRaw
DataCite10.5258/soton/38827515 d agoJSON v1
FieldAssertionExtractorEvidence
concepts[field].fos:materials-engineeringsource · DataCiteconnector:datacite@1.0.0
concepts[field].local:field:materials-sciencemapping · DataCitevocabulary-mapper@1.0.0keywords['Materials Science']
descriptionsource · DataCiteconnector:datacite@1.0.0/data/attributes/descriptions
publication_datesource · DataCiteconnector:datacite@1.0.0/data/attributes/dates
titlesource · DataCiteconnector:datacite@1.0.0/data/attributes/titles/0/title