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Data · dataset · 2026

Citation sources for the review: Study on device failure induced by electric field-driven ion migration in magnetic memory

Listed in ScienceDB

As this work is a review paper, all data and images are derived from previously published literature, and thus no original experimental or simulation data are produced.

Description

A few figures have been assembled using cropping and reproduction techniques solely for illustrative purposes.

Links

Where it is published

Catalogue records · 1

Topics

Inferred from text
Image 65% · Simulation 75%
Provenance · 1 source records, 12 field assertions
SourceKeyLast seenRaw
ScienceDB10.57760/sciencedb.j00273.0007512 d agoJSON v1
FieldAssertionExtractorEvidence
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concepts[field].local:field:life-sciencesmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:social-sciencemapping · scidb cnconnector:scidb_cn@1.0.0
concepts[method].local:method:simulationenrichment · scidb cnkeyword-concept-rules@1.0.0title+description (75%)
concepts[modality].local:modality:imageenrichment · scidb cnkeyword-concept-rules@1.0.0title+description (65%)
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