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Data · dataset · 2025

Research Advances in Deposition Technologies for 13.5 nm Curved Multilayer Optics

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The samples were prepared by DC magnetron sputtering.

Description

X-ray reflectivity (XRR) measurements were conducted using a Panalytical Empyrean X-ray diffractometer with Cu-Kα radiation (λ = 0.154 nm). Spectral tests were performed at the BL08B Metrology Beamline Station of the Hefei National Synchrotron Radiation Laboratory.

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Provenance · 1 source records, 11 field assertions
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ScienceDB10.57760/sciencedb.2779812 d agoJSON v1
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