← Search

Data · dataset · 2026

Effect of Test Capacitor Design on the Piezoelectric Response of Sol-Gel-Derived PZT Thin Films

Listed in ScienceDB

Thin films of PbO, TiO2, and Pb-excess (10%) PZT (52:48) were fabricated using the sol-gel method.

Description

The PbO solution was prepared using lead acetate trihydrate (PbC4H6O4·3H2O, 99.9%) as the lead source, with glacial acetic acid (C2H4O2, 99.8%) and ethylene glycol methyl ether (C3H8O2, 99.5%) as solvents, and acetylacetone (C5H8O2, 99.5%) as a chelating agent. The synthesis was carried out at 130 °C. For the TiO2 solution, titanium isopropoxide (C12H28O4Ti, 98%) was used as the titanium precursor, along with ethylene glycol methyl ether and glacial acetic acid as solvents, and acetylacetone as the chelating agent; this preparation was conducted at room temperature.

The PZT solution was formulated using zirconium n-propoxide (C12H28O4Zr, 70%), titanium isopropoxide, and lead acetate trihydrate as raw materials, with glacial acetic acid and isopropanol (C3H8O2, 99.5%) as solvents. The prepared PZT solution and the mixed solution of PbO and TiO2 are both deposited onto the Si/Pt substrate using spin-coating: first at 500 rpm for 5 seconds for uniform spread, followed by 5000 rpm for 30 seconds to achieve a thin layer.

Read the rest (2 more)

The coated film was subsequently dried at 150 °C in a rapid thermal annealer (RTA), pyrolyzed at 400 °C to eliminate organic residues, and finally crystallized at 700 °C. This coating and annealing cycle could be repeated multiple times to build up the desired film thickness. In order to measure the electrical properties, Au top electrodes were deposited using radio frequency magnetron sputtering (VTC-16-D, Hefei Kejing, China)The morphology and phase structure of the PZT thin films were characterized by field emission scanning electron microscopy (FESEM, Sigma 300, Zeiss) and X-ray diffraction (XRD, AXS D8 Advance, Bruker), respectively.

The dielectric properties were evaluated using an impedance analyzer (4294A, Agilent) to determine frequency-dependent behaviors. The direct piezoelectric coefficient (d33, d) was measured with a piezoelectric constant tester (ZMPiezo-B), while the d33, c was obtained using a laser Doppler vibrometer (Polytec MSA-100-3DSV, Germany).

Links

Where it is published

Catalogue records · 1

Topics

Inferred from text
Microscopy 75%
Provenance · 1 source records, 10 field assertions
SourceKeyLast seenRaw
ScienceDB10.57760/sciencedb.jim.0005812 d agoJSON v1
FieldAssertionExtractorEvidence
concepts[field].local:field:earth-environmentalmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:engineeringmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:humanitiesmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:life-sciencesmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:social-sciencemapping · scidb cnconnector:scidb_cn@1.0.0
concepts[modality].local:modality:microscopyenrichment · scidb cnkeyword-concept-rules@1.0.0title+description (75%)
descriptionsource · scidb cnconnector:scidb_cn@1.0.0/metadata/dc/description
license_textsource · scidb cnconnector:scidb_cn@1.0.0
publication_datesource · scidb cnconnector:scidb_cn@1.0.0
titlesource · scidb cnconnector:scidb_cn@1.0.0/metadata/dc/title