Supporting Data for Multi-Mode Single-Event Evaluation of a Sub-20-nm FinFET Radiation-Tolerant Fractional-N PLL

This dataset provides supporting data for the article “Multi-Mode Single-Event Evaluation of a Sub-20-nm FinFET Radiation-Tolerant Fractional-N PLL.” It contains heavy-ion irradiation and two-photon-absorption pulsed-laser single-event-effect measurement data for a radiation-tolerant fractional-N phase-locked loop fabricated in a sub-20-nm FinFET technology. The dataset includes LET-dependent single-event cross sections measured in integer mode, a controlled comparison between integer and fractional modes at an LET of 86 MeV·cm²/mg, and pulsed-laser triggering thresholds of major functional modules in integer, fractional, and spread-spectrum clocking (SSC) modes.

Key experimental conditions and event-detection criteria required to interpret the measurements are also provided. The dataset supports verification and analysis of the operating-mode-dependent single-event characteristics and radiation tolerance reported in the associated article.