Figure and the corresponding supplementary video for this article

The energy dispersive spectroscopy (EDS) was performed using a scanning electron microscope (SEM, Sigma HD) to investigate the phase composition and elemental distribution within the interface region and TB layer. Prior to the electron back scatter diffraction (EBSD, SM-7900F) examination, the sample underwent electrochemical polishing for 20 s at an applied voltage of 30 V, utilizing a solution composed of 700 ml of 95 % ethanol and 300 ml of 30 % perchloric acid.

EBSD maps generated at a scanning step of 2μm. The acquired experimental data were processed utilizing the HKL Channel5 software. The transmission electron microscope (TEM, FEI Talos F200X) specimens were mechanically ground to a thickness of approximately 50 μm and subsequently electropolished in a solution containing 37 vol% nitric acid and 63 vol% methanol. This process was performed at a temperature of 256 K with an applied current of 13 A. The scanning parameters for X-ray computed tomography (XCT, AL225-01MA) test were set as follows: the voltage was 70 kV, the current was 200 μA, the focus-to-detector distance was 700 mm, and the focus-to-object distance was 15 mm.