Motional Narrowing enabled by Holes Localization for Prolonged Spin Relaxation in CsPbBr3 Films

Characterization of the crystal structure of perovskite thin films using X-ray diffractometer. The surface morphology of the thin film was observed by field emission scanning electron microscopy, and the sample surface was treated with platinum sputtering before testing.

Characterize the surface morphology and roughness of thin films using atomic force microscopy in alternating current mode. The grazing incidence wide-angle X-ray scattering experiment was conducted at the BL17B1 line station of the Shanghai Synchrotron Radiation Source, using X-rays with an energy of 10 keV. In the polarization resolved amplification spontaneous emission test, a 500 nm pulsed laser is used as the excitation light source, focused on the sample surface through a cylindrical lens, and the stripe length of the light spot is controlled by an adjustable slit.