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Data · dataset · 2026

Additional Material for Reviewer

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This Supplementary Material provides detailed information on the fabrication, ion implantation, and post-annealing treatment of Ni-implanted Sb₂Te₃ thin films.

Description

It also presents complementary structural, chemical, morphological, and theoretical analyses, including XRD, XPS, SEM/EDS mapping, and relaxation calculations, together with additional thermoelectric measurements as functions of film thickness and implantation voltage.

These results support the discussion of ion-implantation-induced resonant states and their role in enhancing the thermoelectric response of Sb₂Te₃ thin films.

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Where it is published

Catalogue records · 1

Topics

Inferred from text
Condensed matter physics 70%

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Provenance · 1 source records, 8 field assertions
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